Microscopy & Microanalysis

Microscopy & Microanalysis





Creganna’s materials laboratory is equipped with a comprehensive set of equipment for the preparation and examination of metallic, polymeric, ceramic and composite materials. 

Light optical microscopes are used for general microstructure characterization. Resolution spans from about 380 to 780 nm depending on the microscope with resolution limited by diffraction of the incident light. In order to see smaller, a scanning electron microscope is used.

In a scanning electron microscope, an electron beam is scanned across the surface under investigation. The impact of the beam with the surface generates a cascade of electrons and X-rays that are scattered in all directions. The amount of electrons generated at the surface, and their energy, depend on the topography and on the elements that the analyzed material consists of. Thus, both topographic and elemental information can be obtained. X-ray micro analysis enables qualitative and quantitative chemical composition analysis.

To carry out electron microscopy on polymeric and non conducting specimens, the specimens are either analysed under a low vacuum mode or they are first coated using a high resolution sputter coater. The coater uses a magnetron sputtering system designed to ensure fine grain even coating (Au) over a wide area and enables thin coatings of 2-3 nm to be achieved. The application of a conductive surface coating eliminates charging effects experienced in the SEM with non conducting specimens.  
 

Microscopy assessments include:

  • Weld zone assessment
  • Surface analysis
  • Fractography
  • Grain structure characterization
  • Precipitate and Inclusion analysis
  • JEOL JSM-6480LV Scanning Electron Microscope fitted with Oxford Instruments INCA x-sight X-ray detector
 
View SEM Images
 

SEM Instrument Data

  •  Resolution HV-mode: 3.0 nm at 30kV
  •  Resolution LV-mode: 4.0 nm at 30kV
  •  Acc. Voltage: 0.3 to 30kV
  •  Magnification: 5 – 300,000 X
  •  Stage: 100 x 125 mm
  •  Motorized: 5-axis standard
     

Energy Dispersive X-ray Detector Data

  • Qualitative and quantitative chemical composition analysis
  • Chemical analysis from a spot (<5 mm) or a selected area
  • Compositional mapping from a selected line or area
  • Light Element Window allowing detection of elements from B upwards

 

 

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